Yield Enhanced Layout Strategies for Ratio-Critical Analog Circuits
نویسندگان
چکیده
A yield enhanced layout method for maximizing yield of integrated resistor networks with a fixed total area is discussed. This approach incorporates both random variations in the sheet resistance and random variations in the contact resistances. The concept of contact/sheet resistance crossover which gives the crossover between contact-resistance dominance and sheet resistance dominance is developed.
منابع مشابه
Resistor Layout Techniques for Enhancing Yield in Ratio-Critical Monolithic Applications
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